Scan Based Delay Testing
نویسنده
چکیده
Scan Based Delay Testing is used to perform delay testing in the sequential circuits which have the scan capability. In this paper, basics of delay testing and several techniques to perform delay testing for scan based circuits are discussed. The construction of several scan flip-flops along with their advantages and disadvantages is also presented.
منابع مشابه
A Scan-BIST Structure to Test Delay Faults in Sequential Circuits
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تاریخ انتشار 2005